Search results for "Optical metrology"
showing 2 items of 2 documents
Phase error analysis of clipped waveforms in surface topography measurement using projected fringes
2021
Abstract When working with the method of projected fringes outside the optical laboratory one often encounters the problem of uncontrollable ambient light. This might cause saturation of the camera which in turn results in clipping of the fringes. Since standard theories describing phase-shifting techniques assume the projected fringes to be purely sinusoidal, such clipping will result in measurement error. In this paper a detailed analysis of this problem is given, and relations between phase errors, the amount of fringe clipping and the number of phase steps are found. Moreover, the phase difference between the clipped and the unclipped fringes is described. This investigation is based on…
Projected fringes for the measurement of large aluminum ingots
2010
The method of projected fringes is applied to the measurement of the surface topography of aluminum ingots with surface areas of several square meters. The measurements are performed inside the casting hall of an aluminum factory. To meet the challenges encountered in such a demanding environment, it is important to keep the equipment as simple and robust as possible. Therefore a method for locating the fringe positions with sub-pixel accuracy without using for example phase shifting techniques is applied. Also the nonlinearity of the phase when using divergent illumination is discussed. The developed measuring system is tested measuring eight different aluminum ingots, and the results agre…